World Metrology Day Celebration

Event | 20 May 2020

The Measurement Standards Laboratory celebrated World Metrology virtually on 20 May 2020.

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A Virtual World Metrology Day 2020

20 May 2020 | WEBINAR 1:00 - 2:30 pm

World Metrology Day is an annual celebration to mark the signing of the Metre Convention in 1875, which set the framework for global collaboration in the science of measurement.  Metrology plays a central role in scientific discovery and innovation, industrial manufacturing and international trade, improving the quality of life and protecting the global environment.   

This annual celebration acknowledges the global measurement infrastructure that exists today, 145 years on from the first countries signing the Metre Convention. The theme for World Metrology Day 2020 is Measurements for global trade.

For the first time ever, MSL presented this celebration virtually and had nearly 100 attendees, including a number of our NMIA colleagues and others from Singapore and Egypt.  You can now see the full event recording on the MSL YouTube channel(external link), along with the talks that were pre-recorded prior to the event. 

Programme

1:00 pm

Introduction to World Metrology Day

Fleur Francois - Director, MSL

1:10 pm Update on the new MSL Building commissioning project

Cliff Hastings - Manager Electricity, Time & Frequency

1:20 pm MSL beyond the SI redefinition update and Q&A

Murray Early - Principal Research Scientist

  Pre-recorded talks now available on YouTube(external link)
 
1:40 pm *The MSL Apprentice programme(external link) - live panel discussion and Q&A

Lenice Evergreen - Research Engineer

Nina Wronski - Measurement Technician

Paul Biddick - Air New Zealand Calibration Manager

1:50 pm *The MSL Kibble project update(external link) - live Q&A

Yin Hsien Fung - Research Scientist

2:00 pm *Data Metrology(external link) - live Q&A

Blair Hall - Principal Research Scientist

The Q&A session provided some additional information from our speakers and that document has been attached here. [PDF, 157 KB]