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  • Benz, S.P.; Hamilton, C.A.; Burroughs, C.J.; Harvey, T.E.; Christian, L.A.*. 1997. Stable 1 V programmable voltage standard. Applied physics letters. Vol.71,pp.1866-1868.
  • Christian, L.A.*; Early, M.D.*; Bubanja, V.*. 1999. Taking uncertainty out of AC voltage.
  • White, D.R.*. 2003. Technical guide: Using the Leeds and Northrup 8078 Bridge. Measurement Standards Laboratory. Lower Hutt.
  • Christian, L.A.*; McLennan, B.E.*. 2008. Terminal tightness : improving the stability of a four-terminal standard resistor. CPEM Digest (Conference on Precision Electromagnetic Measurements). Article number 4574696, p.148-149.
  • Bubanja, V.*. 2000. The ac -dc difference of single junction thermal converters. Journal of engineering mathematics. Vol.38 p.33-50.
  • Gabriel, W.P.*. 1967. The future for industrial silicon controlled rectifier equipment. Radio, electronics and communications. Vol.22(6): p.12-14.
  • Bubanja, V.*; van den Brink, A Maasen; Averin, D.V.; Schon, D. 1991. The I-V characteristic of a resistively shunted, small capacitance Josephson junction. Granular nanoelectronics. Ferry, D.K.; Barker, J.R.; Jacoboni, C. (eds). p.567-570. Plenum.
  • Jones, K.*; Corney, A.C.*. 1987. The PEL calculable capacitor. Metrologia. Vol.24: 1-11.
  • Wassilieff, C.*. 1977. The transport properties of nearly magnetic dilute alloys. Proceedings of the Fifth New Zealand Science of Materials Conference : 11-14 December 1977. p.63. DSIR, Physics and Engineering Laboratory. Lower Hutt. Wellington.
  • Bubanja, V.*. 2014. Tunneling rates of electron pumping in the R-SINIS transistor. Journal of low temperature physics. Vol.175, issue 3-4 (May), p.564-579.