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  • Bubanja, V.*. 2014. Tunneling rates of electron pumping in the R-SINIS transistor. Journal of low temperature physics. Vol.175, issue 3-4 (May), p.564-579.
  • Wassilieff, C.*. 1977. The transport properties of nearly magnetic dilute alloys. Proceedings of the Fifth New Zealand Science of Materials Conference : 11-14 December 1977. p.63. DSIR, Physics and Engineering Laboratory. Lower Hutt. Wellington.
  • Jones, K.*; Corney, A.C.*. 1987. The PEL calculable capacitor. Metrologia. Vol.24: 1-11.
  • Bubanja, V.*; van den Brink, A Maasen; Averin, D.V.; Schon, D. 1991. The I-V characteristic of a resistively shunted, small capacitance Josephson junction. Granular nanoelectronics. Ferry, D.K.; Barker, J.R.; Jacoboni, C. (eds). p.567-570. Plenum.
  • Gabriel, W.P.*. 1967. The future for industrial silicon controlled rectifier equipment. Radio, electronics and communications. Vol.22(6): p.12-14.
  • Bubanja, V.*. 2000. The ac -dc difference of single junction thermal converters. Journal of engineering mathematics. Vol.38 p.33-50.
  • Christian, L.A.*; McLennan, B.E.*. 2008. Terminal tightness : improving the stability of a four-terminal standard resistor. CPEM Digest (Conference on Precision Electromagnetic Measurements). Article number 4574696, p.148-149.
  • White, D.R.*. 2003. Technical guide: Using the Leeds and Northrup 8078 Bridge. Measurement Standards Laboratory. Lower Hutt.
  • Christian, L.A.*; Early, M.D.*; Bubanja, V.*. 1999. Taking uncertainty out of AC voltage.
  • Benz, S.P.; Hamilton, C.A.; Burroughs, C.J.; Harvey, T.E.; Christian, L.A.*. 1997. Stable 1 V programmable voltage standard. Applied physics letters. Vol.71,pp.1866-1868.
  • Moore, M.B.; Early, M.D.*; Christian, L.A.*. 2008. Sources of normal mode offset in precision DMM's. CPEM Digest (Conference on Precision Electromagnetic Measurements). Article number 4574970, p.696-697.
  • Bubanja, V.*. 2001. Single electron tunneling phenomena and applications. NZ Institute of Physics. National Conference (10th : 2001).
  • Bubanja, V.*; Matsumoto, K.; Gotoh, Y. 2001. Single electron memory at room temperature : experiment and simulation. Japanese journal of applied physics. Part 1. v. 40, p.87-91.
  • Bubanja, V.*; Matsumoto, K.; Gotoh, Y. 2001. Single electron memory. Annual Condensed Matter and Materials Meeting (25th : 2001 : Marlborough Sounds). 1 p.
  • Bubanja, V.*. 2002. Single electron devices. Proceedings of the 9th Electronics New Zealand Conference 2002, Dunedin. Baehr, John L. (ed). p.47-48. The Conference.
  • Lawson, T.B.; Early, M.D.*; Jones, K.*. 2010. Simulation of a quantum Hall cryogenic current comparator resistance bridge. CPEM Digest (Conference on Precision Electromagnetic Measurements). p.623-624.
  • Corney, A.C.*. 1970. Simple, medium-precision high resistance measuring device. Electronic engineering. Vol.42(510): p.46-47.
  • Jones, K.*; Christian, L.A.*. 1993. Self-calibrating electrical instruments for traceable measurements. AIM-92 : Instrumentation and Measurement : Keys to Technological Advance : Proceedings of Australasian Instrumentation and Measurement Conference : Auckland, New Zealand, 24-27th November 1992. p.251-254. Centre for Continuing Education, University of Auckland. Auckland, NZ.
  • Jones, K.*; Gabriel, W.P.*. 1995. Second APMP resistance intercomparison. IEEE transactions on instrumentation and measurement. Vol.44,pp.196-198.
  • Early, M.D.*; Van Dam, M.A.*. 1999. Results from a detailed calculation of the sensitivity of a cryogenic current comparator. IEEE transactions on instrumentation and measurement. Vol.48(2), p.379-382.