Skip to Content

Search Publications

You can search on any of the criteria listed below. If you use more than one criterion then every item you retrieve will satisfy all criteria you have used.

Click the SEARCH button to activate your search.


  • Metson, J.B.I.; Prince, K.E.; Bittar, A.*; Tornquist, L.J.*. 2001. XPS and SIMS characterisation of TiOxNy solar absorber films. Ionics. Vol.7 (4-6), p.346-350.
  • Zanchet, D.; Hall, B.D.*; Ugarte, D. 2000. X-ray characterisation of nanoparticles. Characterisation of nanophase materials. Wang, Z.L.. p.13-36. Wiley, VCH. Weinheim.
  • Metson, J.B.; Trodahl, H.J.; Ruck, B.J.*; Lanke, N.J.; Bittar, A.*. 2003. X-ray absorption spectroscopy in the analysis of GaN thin films. Surface and interface analysis. Vol.35 no.9 , p.719 - 722.
  • Fischer, J.; Sadli, M.; Ballico, M.; Battuello, M.; Park, C.W.; Saunders, P.*; Yuan, Z.; Yoon, H.; Van der Ham, E.; Sakuma, F.; Machin, G.; Fox, N.; li, W.; Ugur, S.; Matveyev, M.; Bloembergen, P.; Yamada, Y. 2008. Working Group 5. Report to CCT, June 2005. Consultative Committee for Thermometry. 23rd Meeting, Sevres, France, 2005. 5 p.. BPIM. Paris.
  • Fischer, J.; DePodesta, M.; Hill, K.; Moldova, M.; Pitre, L.; White, D.R.*. 2008. Working Group 4 report to CCT. 25 June 2008. Working document. Consultative Committee for Thermometry. 24th Meeting, Sevres, France, 2008. 17 p.. BPIM. Paris.
  • White, D.R.*. 2005. Working Group 3. Report to the CCT, June 2005. Consultative Committee on Thermometry, 23rd meeting, 2005. Working document. BIPM. Paris.
  • Adams, J.; Langhorne, P.; Howick, E.F.*; Haines, E.M. 2002. Women in Physical Science in New Zealand. AIP conference proceedings. Vol.628 p.199-200.
  • Samuel, L.*. 2004. Where are we standing? Metrology in chemistry in New Zealand. CITAC Workshop on Traceability and Uncertainty (2004 : Wellington). Conference presentation.
  • Burden, A.K.; Donaldson, I.G.; Nicholas, J.V.*. 1983. Whakarewarewa data logging equipment. Rotorua monitoring programme progress report July-September 1983. 4 p.. DSIR. Wellington.
  • Hall, B.D.*. 2010. VNA error models : Comments on EURAMET/cg-12/v.01. 21 p. ; PDF (22 p. Creative Commons version). Industrial Research Limited. Lower Hutt.
  • Harris, M.O.; Foster, S.P.; Bittar, A.*; Ekanayake, K.; Looij, K.; Howard, A. 1995. Visual behaviour of neonate larvae of the light brown apple moth. Entomologia, experimentalis et applicata. Vol.77: p.323-334.
  • Nicholas, J.V.*. 1981. Visibility approach towards road lighting codes. IES lighting review. 1981: p.33-36.
  • Samuel, L.*. 2006. Virtual metrology institute : a reality for small countries. Accreditation and quality assurance. Vol.11 no.4, p.184-187.
  • Samuel, L.*. 2004. Virtual metrology institute : a reality for small countries. International Symposium on Metrology in Chemistry (2004 : Beijing). Conference presentation.
  • Samuel, L.*. 2005. Virtual Institute for Metrology in Chemistry : a cost effective way of implementing traceability structure in small countries. Chemical, Biological, Dairy Testing. Professional Advisory Committee (CBDPAC). Meeting (2005). Conference presentation.
  • Love, J.; Samuel, L.*. 2006. Virtual institute for metrology in chemistry : a cost effective way of implementing traceability in chemical and biological measurement. Journal of the New Zealand Institute of Chemistry. Dec. 2006, p.16.
  • Bubanja, V.*. 2008. Virtual electron diffusion through a quantum dot in the presence of electromagnetic fluctuations. Physical review. B, Condensed matter and materials physics. Vol.78 no.15, 23 Oct., Article number 155423 (6 p.).
  • Feistel, R.;; Lovell-Smith, J.W.; Hellmuth, O. 2014. Virial approximation of the TEOS-10 equation for the fugacity of water in humid air. International journal of thermophysics. 25 p.
  • Fitzgerald, M.P.*; Sutton, C.M.*; Jack, D.G.*. 1999. Video camera based sensor to measure gas/oil interface heights for pressures up to 17 MPa. Metrologia. Vol.36, p.627-629.
  • Nicholas, J.V.*. 1981. Vibrational mode interactions with the photoexcited triplet state of naphthalene. Chemical physics letters. Vol.82(2): 225-228.