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  • Metson, J.B.; Trodahl, H.J.; Ruck, B.J.*; Lanke, N.J.; Bittar, A.*. 2003. X-ray absorption spectroscopy in the analysis of GaN thin films. Surface and interface analysis. Vol.35 no.9 , p.719 - 722.
  • Zanchet, D.; Hall, B.D.*; Ugarte, D. 2000. X-ray characterisation of nanoparticles. Characterisation of nanophase materials. Wang, Z.L.. p.13-36. Wiley, VCH. Weinheim.
  • Metson, J.B.I.; Prince, K.E.; Bittar, A.*; Tornquist, L.J.*. 2001. XPS and SIMS characterisation of TiOxNy solar absorber films. Ionics. Vol.7 (4-6), p.346-350.