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  • Nicholas, J.V.*; White, D.R.*. 1994. Traceable temperatures : in introduction to temperature measurement and calibration. 358 p.. Wiley. Chichester.
  • Nicholas, J.V.*; White, D.R.*. 2001. Traceable temperatures : an introduction to temperature measurement and calibration. 420 p.. Wiley. New York.
  • White, D.R.*. 2002. Technical guide: Propagating uncertainty on the SPRT sub-range of ITS-90. 18 p.: PDF. Measurement Standards Laboratory. Lower Hutt.
  • Nicholas, J.V.*; White, D.R.*. 1981. Temperature measurement and calibration workshop notes. 129 p.
  • Nicholas, J.V.*; White, D.R.*. 1983. Supplementary notes to the book #Traceable Temperatures#. 34 p.
  • White, D.R.*. 2002. Technical guide: The Ice point. 1. 2 p.. IRL. Lower Hutt.
  • Bart, M.*; Saunders, P.*; White, D.R.*. 2004. Technical guide: Infrared thermometry ice point. 2. 2 p.. IRL. Lower Hutt.
  • White, D.R.*. 2005. Technical guide: A simple narrow-band thermistor thermometer. 10. 4 p.. IRL. Lower Hutt.
  • White, D.R.*. 2006. Technical guide: Thermometer immersion and dry-block calibrators. 11. 3 p.. IRL. Lower Hutt.
  • White, D.R.*. 2003. Technical guide: Using the Leeds and Northrup 8078 Bridge. Measurement Standards Laboratory. Lower Hutt.
  • White, D.R.*. 2007. Technical guide: Making sense of thermocouples. 4 p.. Measurement Standards Laboratory. Lower Hutt.
  • Saunders, P.*; White, D.R.*. 2007. Technical guide: Correcting radiation thermometers for reflection errors. 4 p.. Measurement Standards Laboratory. Lower Hutt.
  • White, D.R.*. 2007. Technical guide: Resistance measurement for thermometry. 5 p.. Measurement Standards Laboratory. Lower Hutt.
  • Nicholas, J.V.*; White, D.R.*. 1982. Traceable temperatures ; An introductory guide to temperature measurement and calibration. 226 p. DSIR. Wellington.
  • Bittar, A.*; Hamlin, J.D.*; White, M.G.*. 1993. A New Detector Based Spectral Responsivity Scale for the 400 nm to 900 nm Wavelength Range. 12 p.. IRL. Lower Hutt.
  • Bittar, A.*; White, M.G.*. 1992. High resolution spatial uniformity of surface reflectance and response of silicon photodiodes. 14th Symposium on Photonic Measurements. p.121-131.
  • White, D.R.*. 2011. The meaning of measurement in metrology. Accreditation and quality assurance. Vol.16, no.1, p.31-41.
  • Nicholas, J.V.*; White, D.R.*. 1993. Process tube temperature measurements. AIM-92 : Instrumentation and Measurement : Keys to Technological Advance : Proceedings of Australasian Instrumentation and Measurement Conference : Auckland, New Zealand, 24-27th November 1992. p.131-135. Centre for Continuing Education, University of Auckland. Auckland, NZ.
  • White, D.R.*; Jones, K.*; Nicholas, J.V.*; Sutton, C.M.*. 1994. Designing calibrations in a quality environment. AIM-TEC 94 : Third Australasian Instrumentation and Measurement Conference : preprints of papers. p.197-201. Institution of Engineers Australia. Barton,ACT.
  • Saunders, P.*; White, D.R.*. 2013. A focus effect in some thermal imaging systems. AIP Conference Proceedings. Vol.1552, no.8, p.625-630.