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  • Clare, J.F.*; White, D.R.*. 1989. Response time and noise power gain of electrical substitution radiometers with feedback control. Applied optics. Vol.28(15): p.3417-3424.
  • Barnes, T.H.*. 1987. Heterodyne Fizeau interferometer for testing flat surfaces. Applied optics. Vol.26(14): p.2804-2809.
  • Rae, P.J.; Goldrein, H.T.; Bourne, N.K.; Proud, W.G.; Forde, L.C.*; Liljekvist, M. 1998. Automated fine grid technique for measurement of dynamic large-strain deformation maps. Applied Optics and Opto-electronics 1998 : Proceedings of the Optics Divisional Conference of the Institute of Physics held 16-19th March, 1998, Brighton, UK. Gratton, K.T.V. (ed). p.73-78. Taylor & Francis.
  • Bittar, A.*; Kemp, N.T.; Trodahl, H.J. 2001. Ion assisted deposition of amorphous GaN, Raman and optical properties. Applied physics letters. Vol.78(5), p.619-621.
  • Benz, S.P.; Hamilton, C.A.; Burroughs, C.J.; Harvey, T.E.; Christian, L.A.*. 1997. Stable 1 V programmable voltage standard. Applied physics letters. Vol.71,pp.1866-1868.
  • Grigorescu, C.E.A.; Valerio, E.; Monnereau, O.; Tortet, L.; Argeme, L.; Pavelescu, G.; Manea, S.A.; Ducu, C.; Malinovski, A; Trodahl, H.J.; Bittar, A.*; Strickland, N.M.; Notonier, R; Branford, W.R.; Autric, M. 2007. Pulsed laser deposition of Co-based Tailored-Heusler alloys. Applied surface science. Vol.253 (19) p.8102-8106.
  • Metson, J.B.; Ruck, B.J.*; Budde, F.; Trodahl, H.J.; Bittar, A.*; Prince, K.E. 2005. Characterisation of amorphous GaN films. Applied surface science. Vol.244 no.1-4, p.264-268.
  • Sutton, C.M.*. 1997. Traceability of measurement and the role of quality systems in a national metrology institute. Asia Pacific Metrology Programme Symposium on International Traceability of Measurement; National Measurement Laboratory, CSIRO.
  • Fitzgerald, M.P.*; Jack, D.G.*. 2008. Controlled clearance measurements on the MSL 280 MPa pressure balance. Asia Pacific Metrology Programme. Pressure and Vacuum Workshop (4th : 2008). Conference presentation.
  • Nicholas, J.V.*; Sutton, C.M.*; Corney, A.C.*. 1997. The role of a National Metrology Institute in the National Standards and Conformance Infrastructure. Asia Pacific Metrology Symposium (on CD ROM).
  • Nicholas, J.V.*; Sutton, C.M.*; Corney, A.C.*. 1997. Measurement traceability both within and between economics. Asia Pacific Metrology Symposium on CD ROM.
  • Fitzgerald, M.P.*; Sutton, C.M.*. 2007. Application of pooled variance to determining repeatability uncertainty. Asia-Pacific Metrology Programme. Technical Committee Meeting (2007 : Sydney). Conference presentation.
  • Hall, B.D.*. 2014. Measuring signal generator source match. Asia-Pacific Microwave Conference (APMC) (2014 : Sendai, Japan). 3 p..
  • Armstrong, T.R.*; Woollett, G.; Fisk, P.T.H.; Warrington, B.; Butler, D. 2000. Time and frequency distribution within New Zealand. Asia-Pacific Time and Frequency (2000:Tokyo).
  • Samuel, L.*. 2004. New Zealand Metrology in Chemistry work update. Asia/Pacific Metrology Program (APMP). TCQM Meeting (2004). Conference presentation.
  • Samuel, L.*. 2006. New Zealand metrology in chemistry progress update. Asia/Pacific Metrology Program (APMP). TCQM Working Group. Meeting (8th : 2006). Conference presentation.
  • Samuel, L.*. 2002. An Overview of CCQM bio-analysis development. Asia/Pacific Metrology Program. Meeting (APMP) (4th : 2002 : Hanoi). Conference presentation.
  • Forde, L.C.*; Galbraith, S.D.; Bourne, N.K. 1996. An Overview of high-speed photographic research in progress at the Cavendish Laboratory. Association For High-Speed Photography. Annual Conference (1996 : Cambridge). Conference presentation.
  • Forde, L.C.*; Bourne, N.K. 1997. Rod impact : the latest angles. Association For High-Speed Photography. Annual Conference (1997 : Cambridge, UK). Conference presentation.
  • Nield, K.M.*. 1991. Observations and analysis of the southern binary R Arae. Astrophysics and space science. Vol.180 no.2, p.233-252.