Skip to Content

Search Publications

You can search on any of the criteria listed below. If you use more than one criterion then every item you retrieve will satisfy all criteria you have used.

Click the SEARCH button to activate your search.


  • Evolution of the local structure in GaN: O thin films grown by ion-assisted deposition with film thickness.
  • Propagation of uncertainty in modular measurement systems.
  • Depth profile analysis of thin TiOxNy films using standard ion beam analysis techniques and HERDA.